Auditable claim record

DDR throughput and flop aperature test · listed in shuttle

Tiny Tapeout IHP 0p2 · SUPPORTED

urn:vlsi:claim:e3c6e60de619f1e366e26178d15f327e01a5b1c0440d0e0c861ceb7724b4c3a0

Official registry lists this repository, submitted revision and module. The listing does not establish fabrication, manufacture, validation or measured results.

Back to DDR throughput and flop aperature test → · Complete history as JSON · JSON-LD

Evidence

Tiny Tapeout IHP 0p2 official shuttle registry ↗

The Tiny Tapeout IHP 0p2 registry lists this repository at submitted revision 08759f2e61f44df21e0c51d635600d4774c612e5, under module tt_um_wokwi_407306064811090945.

Tiny Tapeout official registry · projects[67]: repository, commit and macro · supports

Published date unknown · Retrieved 2026-10-13T23:58:54.883Z

urn:vlsi:evidence:b49f3c0839333a3b7be3a882ad7efba543104f0dc3da283c3f33e7568c910d71

Assessment history

New assessments preserve earlier records. A correction changes the current interpretation without rewriting what VLSI knew before it.

Recorded assessments, oldest first
Revision	Recorded at (UTC)	Status	Validity	Reviewer & reason
1	2026-10-14T00:04:17.242Z	SUPPORTED	unknown unknown	checked-catalog-source-adapter (adapter) Evidence ingested by official-registry-and-pinned-documents/1.0.0. Explicit upstream evidence only. No fabrication, validation, successful tapeout, measured performance, arbitrary-version interoperability or production qualification is inferred.