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Auditable claim record

DDR throughput and flop aperature test · listed in shuttle

Tiny Tapeout IHP 25a · SUPPORTED

urn:vlsi:claim:52a8859e2b6d5497bc0d996dbf73a6c1be6b011f281b42514a77de8ef5893545

Official registry lists this repository, submitted revision and module. The listing does not establish fabrication, manufacture, validation or measured results.

Back to DDR throughput and flop aperature test → · Complete history as JSON · JSON-LD

Evidence

Tiny Tapeout IHP 25a official shuttle registry ↗

The Tiny Tapeout IHP 25a registry lists this repository at submitted revision 11ff0f101c878350a1e48ff97d9597847228abe2, under module tt_um_wokwi_407306064811090945.

Tiny Tapeout official registry · projects[17]: repository, commit and macro · supports

Published date unknown · Retrieved 2026-10-13T23:58:54.646Z

urn:vlsi:evidence:746699fc42494131c13659f8df0de2802dd56c0f03521961dc3d3022bc78bbf0

Assessment history

New assessments preserve earlier records. A correction changes the current interpretation without rewriting what VLSI knew before it.

Recorded assessments, oldest first
RevisionRecorded at (UTC)StatusValidityReviewer & reason
12026-10-14T00:04:17.027ZSUPPORTEDunknown
unknown
checked-catalog-source-adapter (adapter)

Evidence ingested by official-registry-and-pinned-documents/1.0.0. Explicit upstream evidence only. No fabrication, validation, successful tapeout, measured performance, arbitrary-version interoperability or production qualification is inferred.