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VLSI Korea

Auditable claim record

Latch test · listed in shuttle

Tiny Tapeout IHP 0p2 · SUPPORTED

urn:vlsi:claim:0e864f6e7cbf7f82184504daad64298be92c812f784eb08921f921c83d1317eb

Official registry lists this repository, submitted revision and module. The listing does not establish fabrication, manufacture, validation or measured results.

Back to Latch test → · Complete history as JSON · JSON-LD

Evidence

Tiny Tapeout IHP 0p2 official shuttle registry ↗

The Tiny Tapeout IHP 0p2 registry lists this repository at submitted revision 4f8c38031e2691b6a61ea566261704389af89fdc, under module tt_um_htfab_latch_test.

Tiny Tapeout official registry · projects[7]: repository, commit and macro · supports

Published date unknown · Retrieved 2026-10-13T23:58:54.883Z

urn:vlsi:evidence:869663138ec8a0d700a40247b59c9d995f186efc4c52a10e569515ca2eec3404

Assessment history

New assessments preserve earlier records. A correction changes the current interpretation without rewriting what VLSI knew before it.

Recorded assessments, oldest first
RevisionRecorded at (UTC)StatusValidityReviewer & reason
12026-10-14T00:04:17.224ZSUPPORTEDunknown
unknown
checked-catalog-source-adapter (adapter)

Evidence ingested by official-registry-and-pinned-documents/1.0.0. Explicit upstream evidence only. No fabrication, validation, successful tapeout, measured performance, arbitrary-version interoperability or production qualification is inferred.