Auditable claim record

DDR throughput and flop aperature test · listed in shuttle

Tiny Tapeout GF 0.2 · SUPPORTED

urn:vlsi:claim:b98b4108beb336109af0519e68cd9dbce373183beeaf7fef39d229ae11c67a6d

Official registry lists this repository, submitted revision and module. The listing does not establish fabrication, manufacture, validation or measured results.

Back to DDR throughput and flop aperature test → · Complete history as JSON · JSON-LD

Evidence

Tiny Tapeout GF 0.2 official shuttle registry ↗

The Tiny Tapeout GF 0.2 registry lists this repository at submitted revision 26f5e45b29c7cb9abe27a80d588598ae0285b9d4, under module tt_um_dlmiles_ddr_throughput_test.

Tiny Tapeout official registry · projects[47]: repository, commit and macro · supports

Published date unknown · Retrieved 2026-10-13T23:58:54.191Z

urn:vlsi:evidence:0099a2543925c7587005e096144c8388c1a03c83e99afe2bda80d6c3051ba2dc

Assessment history

New assessments preserve earlier records. A correction changes the current interpretation without rewriting what VLSI knew before it.

Recorded assessments, oldest first
Revision	Recorded at (UTC)	Status	Validity	Reviewer & reason
1	2026-10-14T00:04:16.914Z	SUPPORTED	unknown unknown	checked-catalog-source-adapter (adapter) Evidence ingested by official-registry-and-pinned-documents/1.0.0. Explicit upstream evidence only. No fabrication, validation, successful tapeout, measured performance, arbitrary-version interoperability or production qualification is inferred.